SN74BCT8374ADWR spec: SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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SN74BCT8374ADWR Datasheet e Spec

Fabricante : TI

Embalagem : DW

Pins : 24

Temperature : Min 0 °C | Max 70 °C

Tamanho : 323 KB

Aplicativo : SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS