Path:OKDatasheet > Catalog Datasheet > TI Datasheet > SNJ54BCT8373AFK
SNJ54BCT8373AFK spec: SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SNJ54BCT8373AFK similares
- SNJ5400J
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES
- SNJ5400W
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES
- SNJ5400WA
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES
- SNJ5401J
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
- SNJ5401W
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
- SNJ5402J
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
- SNJ5402J
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
- SNJ5402W
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
SNJ54BCT8373AFK Datasheet e Spec
Fabricante : TI
Embalagem : FK
Pins : 28
Temperature : Min -55 °C | Max 125 °C
Tamanho : 323 KB
Aplicativo : SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SNJ54BCT8373AFK PDF Download
